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FDL-5000型透射电子显微镜的数码影像系统
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在不需要暗室的情况下，为捕获透射电子显微镜图像提供更高的灵敏度，更宽的动态范围和理想线性。FDL5000通过一个可擦写的成像平板读取投射电子显微镜的图像，在动态范围远优于胶片的情况下，得到惊人的25微米像素图像。富士独有的方法完全取消了暗室，为研究者节省下更多的研究时间。 |
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FDL-5000型的特点
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成像平板可调至与传统的投射电子显微镜胶片同样大小 |
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成像平板盒能够满足各种类型的透射电子显微镜，包括：JEOL，Hitachi，Zeiss和Phillips等品牌机型 |
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比胶片更高的灵敏度 |
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成像平板探测区与传统的胶片一样大小而且要灵敏的多，使研究人员能够容易地观察到对光束敏感的样品，磷屏尺寸与大多数的胶片相同，所以IP可以用于任何TEMs |
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捕获各个级别的强度用于精确分析 |
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成像平板天生的宽动态范围比胶片要出众的多。在一个单独的画面内强度变化很大的衍射图案都能都被观察到 |
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准确地测量电子剂量 |
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FDL5000的线性信号强度使得衍射图案电子剂量的测量成为可能，而且HERM图像比胶片要精确的多。数字处理的功能也能够帮助增强和显现所期望的结构部分 |
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相片质量的图像 |
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Pictrography打印机能够在6分钟之内传送出相片质量的图像 |
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FDL-5000型的应用
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Capture high-resolution images of superb clarity
25µm-pixel, high-resolution images deliver clear visualization of
your specimen, even when a high-speed shutter is used.
View of HNb2O5 from a Hitachi H-1250.
Accelerating voltage: 1000 kV
Magnification: x 800,000
Electron dose (C/cm2): 4 x 1012.
(Data courtesy of Dr. Naoki Yamamoto, Tokyo Institute of Technology)
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Adjust images quickly and reliably with Image Gauge
Brightness/Contrast functions in Image Gauge - standard on all FDL
5000 systems - deliver clear images quickly and reliably.
View of carbon nanotube from a Phillips EM400.
Accelerating voltage: 120kV
Magnification: x 300,000.
(Data courtesy of Dr. Yahachi Saito, Mie University.) |
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Enhance your observation of low-contrast images
Wide-angle detection and 3,760 x 3,000 resolution provide superb
visualization of low-contrast images.
Cross-sectional view of radish leaf from a Hitachi H-7100.
Accelerating voltage; 100kV
Magnification: x 8,500.
(Data courtesy of Hitachi Ltd., Instruments Division) |
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Obtain photographic-grade images without the use of film
Using the Fujifilm FDL 5000, you can easily obtain a final, photographic-grade
image without tedious darkroom work.
View of insect compound eye from a Topcon EM002B/Bio-p.
Accelerating voltage: 80kV
Magnification: x 50.
(Data courtesy of Topcon Corp.) |
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Capture high-quality, low-dose images through excellent sensitivity
The use of an Imaging Plate maximizes the effect of energy filters.
Diffraction pattern of compound semiconductor from a Zeiss EM912
OMEGA. Accelerating voltage: 120kV; Zero-loss image.
(Data courtesy of Dr. Daisuke Shindo, Tohoku University; Dr. J.C.H.
Spence, Arizona State University; and Dr. Akiko Gomyo, NEC.) |
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Detecting beam |
Electron beam (40 kV - 100 kV) |
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IP size |
99.6 x 80.9 mm |
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Effective area |
94.0 x 75.0 mm |
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Readout pixel size |
25µm / 50µm |
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Bit depth |
14 bits (16,384 gray levels) |
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Latitude (dynamic range) |
4 orders of magnitude/1 frame |
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Sensitivity |
2 x 10-14 - 2 x 10-9 C/cm2 (100 kV) |
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Readout time |
Approx. 2.5 min/1 frame |
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Power conditions |
AC100 -120 / 200-240 V |
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Voltage regulation |
-10% - +10% |
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Frequency |
50 - 60 Hz |
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Power consumption |
0.4 kVA (100 V / 200 V) |
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Dimension |
800 (W) x 726 (D) x 1058 (H) mm |
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Weight |
190 kg |
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系统工作流程； 有了FDL5000，您就可以连续地记录、显示、打印、存储电镜影像，而无需费时费力地使用胶片和暗房。 |
